Last edited by Mogor
Tuesday, July 28, 2020 | History

5 edition of Modeling of electrical overstress in integrated circuits found in the catalog.

Modeling of electrical overstress in integrated circuits

by Carlos H. DiМЃaz

  • 156 Want to read
  • 8 Currently reading

Published by Kluwer Academic Publishers in Boston .
Written in English

    Subjects:
  • Integrated circuits -- Protection -- Computer simulation,
  • Electric discharges -- Computer simulation

  • Edition Notes

    Includes bibliographical references (p. [133]-141) and index.

    StatementCarlos H. Díaz, Sung-Mo (Steve) Kang, Charvaka Duvvury.
    SeriesThe Kluwer international series in engineering and computer science
    ContributionsKang, Sung-Mo, 1945-, Duvvury, Charvaka, 1944-
    Classifications
    LC ClassificationsTK7874 .D498 1995
    The Physical Object
    Paginationxxiii, 148 p. :
    Number of Pages148
    ID Numbers
    Open LibraryOL1106026M
    ISBN 100792395050
    LC Control Number94031195

    This book covers algorithmic aspects of computer aided circuit design for VLSI of large circuits. The large scale aspect of VLSI requires a reorientation towards new and more efficient techniques. Many algorithms have survived the test of time, while others are suffering from the usual problem of polynominal or exponential running time complexity and storage requirements.   Today I'm going to discuss electrical overstress of analog integrated circuits. This is an example of an analog integrated circuit that's been subjected to an extreme electrical overstress event in a circuit. In this particular case, the EOS that was applied to the device was so extreme that the device latched on, conducted very high current.

    Electrical Modeling Page 1 Introduction to Electrical Systems Modeling Part I. DC analysis techniques DC analysis techniques are of course important for analyzing DC circuits—circuits that are not dynamic. But why do we discuss them in a dynamic systems class? Firstly, they provide good practice and help build intuition for Size: KB. Designed Primarily For Courses In Operational Amplifier And Linear Integrated Circuits For Electrical, Electronic, Instrumentation And Computer Engineering And Applied Science Students. Includes Detailed Coverage Of Fabrication Technology Of Integrated Circuits. Basic Principles Of Operational Amplifier, Internal Construction And Applications Have Been Discussed.4/5(21).

    Wholesale Of Integrated Circuits By at low prices. Save more than 80% on retail. Shop for Of Integrated Circuits By now. Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of E Läs mer».


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Modeling of electrical overstress in integrated circuits by Carlos H. DiМЃaz Download PDF EPUB FB2

Modeling of Electrical Overstress in Integrated Circuits presents a comprehensive analysis of EOS/ESD-related failures in I/O protection devices in integrated circuits.

The design of I/O protection circuits has been done in a hit-or-miss way due to the lack of systematic analysis tools. This book covers techniques for modeling electrical overstress and electrostatic discharge failures in integrated circuits.

It is written at a technical level for engineers, designers, and specialists in the fields of EOS/ESD and power failures. A good reference to have in your library. COVID Resources. Reliable information about the coronavirus (COVID) is available from the World Health Organization (current situation, international travel).Numerous and frequently-updated resource results are available from this ’s WebJunction has pulled together information and resources to assist library staff as they consider how to handle coronavirus.

Modeling of Electrical Overstress in Integrated Circuits (The Springer International Series in Engineering and Computer Science) by Carlos H. Diaz, Sung-Mo (Steve) Kang, Charvaka Duvvury and a great selection of related books, art and collectibles available now at Modeling of Electrical Overstress in Integrated Circuits is for VLSI designers and reliability engineers, particularly those who are working on the development of EOS\/ESD analysis tools.

CAD engineers working on development of circuit level and device level electrothermal simulators will also benefit from the material covered.

Díaz C.H., Kang SM., Duvvury C. () Electrical Overstress in Integrated Circuits. In: Modeling of Electrical Overstress in Integrated Circuits. The Springer International Series in Engineering and Computer Science, vol Cited by: 1.

Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes.

Modeling of Electrical Overstress in Integrated Circuits presents a comprehensive analysis of EOS/ESD-related failures in I/O protection devices in integrated. Modeling of Electrical Overstress in Integrated Circuits (The Springer International Series in Engineering and Computer Science) (Book) Book Details.

ISBN. Title. Modeling of Electrical Overstress in Integrated Circuits (The Springer International Series in Engineering and Computer Science) Author. Diaz, Carlos H. & Sung-Mo (Steve. • Electrical Overstress Definition – Any electrical stimulus (voltage or current) that exceeds a part’s rated operating conditions – Very broad category of stress • Nanoseconds to milliseconds (sometimes days) in duration • pJ to KJ in energy – Failure modes are dependent on the magnitude andFile Size: KB.

Historically, the discussion about electrical overstress seems to have originated from the interest to characterize the failure thresholds of discrete bipolar semiconductor components.

Later, the characterization effort was extended to MOS devices and simple integrated circuits.Cited by: 3. Common misconceptions regarding electrical overstress (EOS) and the failure characteristics of integrated circuits (ICs) are summarized, analyzed and clarified.

On-Chip ESD Protection for Integrated Circuits: An IC Design Perspective - Ebook written by Albert Z.H. Wang. Read this book using Google Play Books app on your PC, android, iOS devices. Download for offline reading, highlight, bookmark or take notes while you read On-Chip ESD Protection for Integrated Circuits: An IC Design Perspective.

This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices.

Electrical overstress (EOS) and electrostatic discharge (ESD) are a major cause for field failures in integrated circuits. Effective design of I/O protection circuits is important to achieve. Common misconceptions regarding electrical overstress (EOS) and the failure characteristics of integrated circuits (ICs) are summarized, analyzed and clarified.

In order to avoid EOS fails right from the beginning of the IC design process, a methodology is proposed that accounts for the special characteristics of ICs and their applications in Cited by: 2. Electronic components have a wide range of failure can be classified in various ways, such as by time or cause.

Failures can be caused by excess temperature, excess current or voltage, ionizing radiation, mechanical shock, stress or impact, and many other semiconductor devices, problems in the device package may cause failures due to contamination, mechanical stress of. Engineering, Electronics and Electrical Abstract: It is proposed in this thesis that a measure to determine the electrical overstress (EOS) hardness of integrated circuits with respect to EOS/electrostatic discharge (ESD) can be measured in terms of the power vs.

time-to-failure relationship (power profile) and the current vs. time-to-failure. Learn how to avoid electrical overstress and prevent damage your analog integrated circuit from precision amps expert Thomas Kuehl. This book, ESD: Circuits and Devices, is part of a 3-book series on Electrostatic Discharge (ESD) by the same author (Steven Voldman).

One of the main strengths of this series (and there are very many) is that this is very recently published with new and updated datapoints, not to /5(6). What is EOS. Electrical Overstress, or EOS, is a failure state wherein the device is subjected to undesirable voltage, current, or can destroy a component in many ways, resulting in observable signs of damage or failure attributes.

These signs may include burns, excessive heat generation of components, shorts and open circuitry. Download CMOS Integrated Circuits Books – We have compiled a list of Best & Standard Reference Books on CMOS Integrated Circuits Subject for Electrical Engineering & Electronics and Communication Engineering Students & for books are used by many students & graduates of top universities, institutes and [email protected]{AmerasekeraESDIS, title={ESD in silicon integrated circuits}, author={E.

Ajith Amerasekera and Charvaka Duvvury}, year={} } E. Ajith Amerasekera, Charvaka Duvvury Published ESD Phenomena and Test Methods The Physics of .Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection.

It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.